Serial Test Extension and Generalization to Test the Digital Sequences | ||
| Al-Mustansiriyah Journal of Science | ||
| Article 1, Volume 25, Issue 4, December 2014, Pages 83-96 | ||
| Author | ||
| Sudad Khalil Ibraheem | ||
| Abstract | ||
| The serial test is one of the standard statistical randomness tests. It is found to test the approximation of binary pairs (2-tuple) of bits for the binary sequences generated from binary stream cipher generators, which depend on shift registers. In this paper, first we attempt to extend the 2-tuple to d-tuple (d3) to apply binary serial test for binary sequences. Second, we will generalize the 2-tuple binary serial test to 2-tuple digital serial test for digital (m-) sequences (m3) generated from digital generators. Lastly, we will extend the 2-tuple to d-tuple digital serial test for digital sequences. The results of randomness of applying the binary and digital serial tests in the binary and digital (m-) sequences were introduced in special tables using hypothesis test with Chi-square test. | ||
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