A study of Some Electrical Properties of Te:S Thin Films Deposited at Angle Ө=70o | ||
| Ibn Al-Haitham Journal For Pure And Applied Science | ||
| Article 1, Volume 27, Issue 1, April 2014, Pages 121-128 | ||
| Authors | ||
| Farah J. Khadum; Hanaa S. Sabaa | ||
| Abstract | ||
| In this research a study of some electrical properties Of (Te) thin films with(S) impurities of(1.2%) were deposited at( Ө=700)by thermal evaporation technique .The thicknesses of deposited films were (1050 , 1225 , 1400 , 1575 nm) on a glass substrates of different dimensions . From X-ray diffraction spectrum, the films are polycrystalline .A study of (I-V) characteristic for thin films, the measurements of electrical conductivity (σ)and electrical resistance(R )vs. temperature( T) are done. Further a measurement of thermoelectric power, see beck coefficient and activation energies ( Ea, Es) were computed. | ||
| Keywords | ||
| Te S films; obliquely deposited films | ||
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