Measurement of the Electro-Optic Coefficients In Electro-Optic Crystals using Compensated Sénarmont System | ||
| Basic Education College Magazine For Educational and Humanities Sciences | ||
| Article 1, Volume 0, Issue 0, January 2018, Pages 445-449 | ||
| Authors | ||
| H. L. Saadon; M. A. Rahma | ||
| Abstract | ||
| Electro-optic crystal have received considerable attention for many application due to their large electro-optic (EO) and nonlinear optical coefficients [1,2]. Several techniques have been designed for the characterization of the electro-optic properties of bulk samples [3,4]. The disadvantage of these systems are that it require a high ac modulated voltage (up to 300 Vp-p) and the material be made with a large EO coefficients. | ||
| Keywords | ||
| Measurement of the Electro; Optic Coefficients In Electro; Optic Crystals using Compensated S | ||
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