K.al- Bity, E., M. obead, A., A. Abdullah, R., Aani, , A. al, M. (2012). Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction. Alustath, 8(4), 1-9.
Ebtisam K.al- Bity; Ahmad M. obead; Rasha A. Abdullah; Aani; Muhammad A. al. "Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction". Alustath, 8, 4, 2012, 1-9.
K.al- Bity, E., M. obead, A., A. Abdullah, R., Aani, , A. al, M. (2012). 'Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction', Alustath, 8(4), pp. 1-9.
K.al- Bity, E., M. obead, A., A. Abdullah, R., Aani, , A. al, M. Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction. Alustath, 2012; 8(4): 1-9.

Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction

Diyala Journal For Pure Science
Article 1, Volume 8, Issue 4, December 2012, Pages 1-9
Authors
Ebtisam K.al- Bity; Ahmad M. obead; Rasha A. Abdullah; ; Muhammad A. al
Abstract
A polycrystalline CdS Films have been evaporated by thermal evaporation technique
with different thicknesses under vacuum of about 8 × 10-5 mbar and substrate temperature of
about 373 K on glass substrates, the films annealed at 573K for different duration times (60,
120 and180 min.). The structural properties of the films have been studied by X- ray
diffraction technique, some structural parameters like miller indices, dstnd, dexp, I/Io stnd and I/Io
have been calculated and compared for the CdS alloy and films.
Keywords
structural proparties CdS or thin film CdS
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