Studies on Physical Properties of SnO2: Co Nano-crystalline Thin Films Prepared by Spray Pyrolysis Technique | ||
Al-Mustansiriyah Journal of Science | ||
Article 1, Volume 23, Issue 6, September 2012, Pages 173-182 | ||
Author | ||
Ali Jasim AL-Jabiry | ||
Abstract | ||
Highly transparent and conductive thin films of SnO2 and SnO2: Co have been prepared on glass substrates using spray pyrolysis technique from SnCl4.5H2O precursor . Structural and optical properties were studied under different preparation conditions like doping concentration (2%, 4% and 6%). These prepared films are polycrystalline with a tetragonal crystal structure. The crystallinity and the particle size of the prepared samples were analyzed by X-ray diffraction ( XRD ) spectroscopy, the results indicated that all samples had a good crystallinity, and the particle size of the prepared samples decreased with the increase of Co doping concentrations Some of the structure properties are changed by the addition Co concentrations as dopants. The films are preferentially oriented along the (101) direction. We have got some surface morphology and the roughness measured by Atomic Force Microscopy (AFM), the results show increasing of roughness with doping concentration up to 4wt.%. The films have moderate optical transmission (up to 80% at 800 nm), and the transmittance, absorption coefficient and energy gap were measured and calculated with increasing Co doping concentration, the results show that the doping caused to decreased the transmittance and energy gap while it caused to increase the absorption coefficient. SnO2 semiconductor thin film having thickness 90–123 nm and nanocrystallite size 24 - 60 nm is obtained. Similarly, the corresponding values of surface roughness are 3.7, 5.8, 9.4 and 6.72 nm, respectively. | ||
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