A Comparison of Kodak DEF, CX and AX films using soft X-ray wavelengths | ||
Tikrit Journal of Pure Science | ||
Article 1, Volume 17, Issue 4, December 2012, Pages 148-150 | ||
Authors | ||
Basim A. Shiwai; Mustafa Husam saied | ||
Abstract | ||
Kodak direct exposure film (DEF), Kodak industrex films CX and AX have been compared , using a DC X-ray source generating 1.5KeV soft X-rays .Characteristic curves are presented for the three films, also detective quantum efficiency were measured as a function of the incident X-ray flux.The effect of developer temperature on the characteristic curve has been also investigated. | ||
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