Study the Effect of Thermal Treatment and Variation of CdS Thickness on Structural Properties of CdS/CdTe Heterojunction | ||
| Journal of University of Anbar for Pure Science | ||
| Article 19, Volume 4, Issue 1, April 2010, Pages 54-59 PDF (292.1 K) | ||
| Document Type: Research Paper | ||
| DOI: 10.37652/juaps.2010.43887 | ||
| Authors | ||
| Kadhim A.Al-Hamdani* 1; Ghuson H.Mohamed1; Enas S.Y. Al-Mizban2 | ||
| 1University of Baghdad - College of Science | ||
| 2University of Anbar - College of Medicine | ||
| Abstract | ||
| A polycrystalline CdS/CdTe heterojunction prepared by thermal evaporation technique at substrate temperature of 373 K and heat treatment for annealing temperature 573 K for different duration times of annealing (ta) 60 and 120 min. under vacuum of (10-5) mbar and different thicknesses of CdS layer of about 1000Å, 1500Å and 2000Å. The X-ray diffraction (XRD) technique shows polycrystalline structure and had a mixture of cubic and hexagonal structure.The recrystallization of films enhanced thermally represented by increasing the grain size. The CdS/CdTe heterojunction with the higher thickness of CdS layer shows better crystal structure | ||
| Keywords | ||
| Thermal Treatment; variation; CdS; Structural properties; Heterojunction | ||
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