Effect of Thickness on the Structural and Optical Properties of (Bi2O3) thin films | ||
| Journal of College of Education | ||
| Article 1, Volume 0, Issue 5, November 2017, Pages 75-88 | ||
| Authors | ||
| Bushra. K.H.Al-Maiyaly; Nassr. I.Najm | ||
| Abstract | ||
| In this research , the influence of different thickness (250,350 and 450 ±20 nm) on the structural and optical properties have been investigated on the thin films of (Bi2O3) which deposited on glass substrates using thermal evaporation technique under vacuum , ( XRD) is used to characterize the structural properties, the results indicate that all films prepared have polycrystalline structure with preferentially oriented in the [ 201] with tetragonal structure, The optical analyses shows that these films have high absorption coefficient ( α > 104 cm-1 ) and direct energy gap which increase with the increase of film thickness , Also optical measurements shows that , the values of absorption coefficient , refractive index , extinction coefficient , the dielectric constants with both parts real and imaginary Optical Conductivity are change with on film thickness for the wavelength in the range ( 300 – 1100 nm ) . | ||
| Keywords | ||
| structural and optical properties; Bismuth oxide films; Thermal evaporation | ||
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