A. Abdullah, A., M. Elias, M., s. Shafiq, S. (2004). Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique. Alustath, 1(1), 149-153.
Ali A. Abdullah; Mazin M. Elias; Shafiq s. Shafiq. "Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique". Alustath, 1, 1, 2004, 149-153.
A. Abdullah, A., M. Elias, M., s. Shafiq, S. (2004). 'Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique', Alustath, 1(1), pp. 149-153.
A. Abdullah, A., M. Elias, M., s. Shafiq, S. Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique. Alustath, 2004; 1(1): 149-153.

Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique

Baghdad Science Journal
Article 1, Volume 1, Issue 1, June 2004, Pages 149-153
Authors
Ali A. Abdullah; Mazin M. Elias; Shafiq s. Shafiq
Abstract
Doppler broadening of the 511 keV positron annihilation ٨٠؛ ا was used to estimate the concentration of defects اة different deformation levels of pure alnminum samples. These samples were compressed at room temperature to 15, 22, 28, 38,40, and 75 % thickness reduction. The two-state ^sitron-trapping model has been employed. 'I he s and w lineshape parameters were measured using high-resolution gamma spectrometer with high pure germanium detector of 2.1 keV resolution at 1.33 MeV of 60Co. The change of defects concentration (Co) with the deformation level (e) is found to obey an empirical formula of the form Cd - A £ B where A and ٥ are positive constants that depend mainly on the deformation procedure and the temperature at which the deformation takes place.
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