Properties of Nano Thin Film Composed of Nan Crystalline Zro2 Prepared by (SOL - GEL) Method | ||
| Engineering and Technology Journal | ||
| Article 1, Volume 32, 1B, January 2014, Pages 23-32 PDF (502.78 K) | ||
| DOI: 10.30684/etj.32.1B.4 | ||
| Authors | ||
| Kassim Mohammed Sahan; Aqel Mashot Jafar | ||
| Abstract | ||
| Nano-crystalline ZrO2 was prepared by sol-gel method and deposited on glass substrate by dip-coating technique method in the room temperature. ZrOCl2 was dissolved in a solvent mixture composed of H2O2 and ammonia. The dissolving reaction produced a colorless, transparent peroxozirconium complex solution. The mean nanocrystalline size was about 7.55 nm. The zirconium film thus obtained was transparent 90% with 5.03 eV band gap. Atomic force microscopy (AFM), X-ray diffraction and (UV-Vis) used to determine the properties of the thin film. The as-deposited thin film was of high purity of ZrO2 and good adhesion to the substrate. The annealing was caused crystallization of tetragonal and monoclinic phase present in the zirconia at 550°C in air. The film showed very flat surfaces consisting of nanoparticles with particle size of ranging (2-10 nm). | ||
| Keywords | ||
| ZrO; sol; Gel processing; crystallization; Nano; thin film; AFM; XRD; Energy gap | ||
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